Quantitative Atomic-Resolution Electron Microscopy, Volume 217, thelatest release in theAdvances in Imaging and Electron Physicsseries merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Theseries features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. Contains contributions from leading authorities on the subject matterInforms and updates on the latest developments in the field of imaging and electron physicsProvides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource | Quantitative Atomic-resolution Electron Microscopy by Hÿtch Hÿtch, Hardcover | Indigo Chapters